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Facilities

Surface characterization

Introduction

Atomic force microscopy (AFM)

NX-10

Park Instruments (KR)

Contact AFM,
NC-AFM, Tapping AFM, C-AFM, PCM, EC-AFM, and Other modes.

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Optical microscopy

DM2000

Leica (GER)

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O2 plasma cleaner

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Spin coater

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