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Facilities
Surface characterization
Introduction
Atomic force microscopy (AFM)
NX-10
Park Instruments (KR)
Contact AFM,
NC-AFM, Tapping AFM, C-AFM, PCM, EC-AFM, and Other modes.
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Optical microscopy
DM2000
Leica (GER)
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O2 plasma cleaner
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Spin coater
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