top of page
Zetasizer.jpg

Facilities

Surface characterization

Introduction

Atomic force microscopy (AFM)

NX-10

Park Instruments (KR)

​

  • Model:

  • Manufacturer:

  • Description:

No image.jpg

Optical microscopy

DM2000

Leica (GER)

​

  • Model:

  • Manufacturer:

  • Description:

No image.jpg

O2 plasma cleaner

​

​

​

  • Model:

  • Manufacturer:

  • Description:

No image.jpg

Spin coater

​

​

​

  • Model:

  • Manufacturer:

  • Description:

No image.jpg
bottom of page